Periodic Morphologies via FIB induced Self-Organization and Site-Specific Defect Engineering on hBN
Bhaveshkumar Kamaliya (Tom Folland presenting)McMaster University, Hamilton, Ontario, Canada _______________________________________ Focused Ion Beam (FIB) has been extensively used for direct milling for Nano- and Micro-structures. The foremost leverage using FIB, as compared to conventional lithography processes, for nanofabrication is that it is a mask-less (direct-writing) and single-step nanopatterning technique; however, it operates on a pixel-by-pixel…